Characterization of near-surface application materials suitable sample preparation. It is to know the location and orientation of the sample, and if possible to perform the analysis in the same device to prevent contamination.
Technology now known for this type of preparation is that the FIB or FIB (Focused Ion Beam). Gallium ions are used to tear the material with a spatial resolution of a few hundredths of a micron. This is coupled to it an electron beam (“dual beam” instrument) so as to make, on a FIB machined blade, a structure analysis in STEM (Scanning Transmission Electron Microscopy) analysis and a chemical composition by energy dispersive (EDX).
MANUTECH-USD will have a current 2014 equipment FIB-EDX.
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